J. Müller, S. Hooker, D. Balzar, Microstructure-Controlled Multilayer PZT Actuators: Effects of Cyclic Actuation on Crystallographic Structure, in Materials and Devices for Smart Systems II, edited by Yasubumi Furuya, Ji Su, Ichiro Takeuchi, Vijay K. Varadan, John Ulicny (Mater. Res. Soc. Symp. Proc. 888,
Warrendale
,
PA
, 2006), V08-03.
D. Balzar, N. Audebrand, M. Daymond, A. Fitch, A. Hewat, J.I. Langford, A. Le Bail, D. Louër, O. Masson, C.N. McCowan, N.C. Popa, P.W. Stephens, B. Toby,Size-Strain Line-Broadening Analysis of the Ceria Round-Robin Sample,Journal of Applied Crystallography37 (2004) 911-924.
N. C. Popa, D. Balzar , G. Stefanic, S. Vogel, D. Brown, M. Bourke, B. Clausen, Residual-Strain Determination by Least-Squares Refinement of TOF Neutron-Diffraction Measurements of Deformed Uranium, Advances in X-Ray Analysis 47 (2004) CD-ROM, in press.
D. Balzar, N.C. Popa, Residual Strain/Stress and Crystallite Size Modeling in Rietveld Refinement, in Diffraction Analysis of the Microstructure of Materials, edited by E.J. Mittemeijer and P. Scardi (Springer, 2004) pp.125-145, invited.
A.M. Hermann, Y.T. Wang, P.A. Ramakrishnan, D. Balzar, Linan An, C. Haluschka, R. Riedel, Structure and Electronic Transport Properties of Si-(B)-C-N Ceramics, Journal of the American Ceramic Society84 (2001) 2260-2264.
A.M. Hermann, C. Gonzalez, P.A. Ramakrishnan, D. Balzar, C.H. Marshall, J.N. Hilfiker, T. Tiwald, Growth and characterization of large area Cu(In,Ga)Se2 films, Thin Solid Films 387 (2001) 54-56.
A.M. Hermann, C. Gonzalez, P.A. Ramakrishnan, D. Balzar, N. Popa, P. Rice, C.H. Marshall, J.N. Hilfiker, T. Tiwald, P.J. Sebastian, M.E. Calixto, R.N. Bhattacharya, Fundamental studies on large area Cu(In,Ga)Se2 films for high efficiency solar cells, Solar Energy Materials & Solar Cells70 (2001) 345-361.
J. Perkins, D. Readey, J. Alleman, J. del Cueto, X. Li, T. Coutts, R. Stauber, C. Duncan, D. Young, P. Parilla, B. Keyes, L. Gedvilas, D. Balzar, Q. Wang, D. Ginley, A Combinatorial Approach to TCO Synthesis and Characterization, Materials Research Society Symposium Proceedings Volume 666, Transport and Microstructural Phenomena in Oxide Electronics, Edited by D.H. Blank, D.S. Ginley, M.E. Hawley, S.K. Streiffer, D.C. Paine, Materials Research Society, Pittsburgh, Pennsylvania, 2001
D. Balzar, Voigt-Function Model in Diffraction Line-Broadening Analysis, in Defect and Microstructure Analysis from Diffraction, edited by R.L. Snyder, H.J. Bunge, and J. Fiala, International Union of Crystallography Monographs on Crystallography No. 10 (Oxford University Press, New York, 1999) pp. 94-126, invited.
D. Balzar, S. Popovic, Reliability of the Simplified Integral-Breadth Methods in Diffraction Line-Broadening Analysis, Journal of Applied Crystallography29 (1996) 16-23.
D. Balzar, H. Ledbetter, Accurate Modeling of Size and Strain Broadening in the Rietveld Refinement: the "Double-Voigt" Approach, Advances in X-ray Analysis38 (1995) 397-404.
M. Paranthaman, M. Foldeaki, D. Balzar, H. Ledbetter, A.J. Nelson, A.M. Hermann, Enhanced Flux Pinning via Chemical Substitution in Bulk Superconducting Tl-2212, Superconductor Science and Technology7 (1994) 227-233.
D. Balzar, H. Ledbetter, Crystal Structure and Compressibility of 3:2 Mullite, American Mineralogist78 (1993) 1192-1196.
D. Balzar, X-ray Diffraction Line Broadening: Modeling and Applications to High-Tc Superconductors, Journal of Research of the NIST98 (1993) 321-353.
D. Balzar, H. Ledbetter, Voigt-Function Modeling in Fourier Analysis of Size- and Strain-Broadened X-ray Diffraction Peaks, Journal of Applied Crystallography26 (1993) 97-103.
D. Balzar, Profile Fitting of X-ray Diffraction Lines and Fourier Analysis of Broadening, Journal of Applied Crystallography25 (1992) 559-570.
D. Balzar, H. Ledbetter, A. Roshko, Stacking Faults and Microstrain in La1.85M0.15CuO4 (M=Ca,Ba,Sr) by Analyzing X-ray Diffraction Line Broadening, Physica C185-189 (1991) 871-872.
